Jongin Lim

AI Researcher @ Samsung AI Center

Industrial AI  |  Agent  |  Multimodal RAG  |  Robustness

About Me

I'm a Staff Researcher at Samsung AI Center (formerly SAIT AI Research Center), developing robust and efficient machine learning models tailored for industrial applications. My work has focused on AI-driven automation in manufacturing, spanning diverse modalities including vision, language, structured data (e.g., graph, tabular), and time-series domains.

I received my Ph.D. (through an integrated M.S./Ph.D. program) in Electrical and Computer Engineering from Seoul National University in 2022, under the supervision of Prof. Jin Young Choi. I received my B.S. in Electrical and Computer Engineering from Seoul National University in 2016.

2025 – Present

Staff Researcher

AI Center, Samsung Electronics

2022 – 2025

Staff Researcher

Samsung Advanced Institute of Technology (SAIT)

2016 – 2022

Ph.D., Electrical and Computer Engineering

Seoul National University

Advisor: Jin Young Choi

2011 – 2016

B.S., Electrical and Computer Engineering

Seoul National University

Research Interests

Industrial AI

Developing generalizable and transferable AI models for industrial applications

Agent

Building domain-specific AI agents that reason, plan, and interact with tools and environments

Multimodal RAG

Enhancing AI agents with external multimodal knowledge retrieval for accurate and grounded responses

Robustness

Improving model robustness under data imbalance, distribution shifts, and noisy labels

Publications

My research focuses on developing generalizable and transferable ML models for real-world applications. Recently, I have worked on improving model robustness under data imbalance (e.g., IB, PRIME), distribution shifts (e.g., BiasAdv), and noisy labels (e.g., SLC), but I am open to exploring a broader range of topics. First-author papers are highlighted.

Patents

Method and Device with Image-Difference Reduction Preprocessing [Google Patent]

  • 🇰🇷 KR20250020150A, South Korea (Publication: 2025-02-11)
  • 🇺🇸 US20250045884A1, United States (Publication: 2025-02-06)
  • 🇹🇼 TW202507651A, Taiwan (Publication: 2025-02-16)
  • 🇪🇺 EP4502936A3, European Patent Office (Publication: 2025-05-14)
  • 🇨🇳 CN119444583A, China (Publication: 2025-02-14)

Method and Electronic Device with Adversarial Data Augmentation [Google Patent]

  • 🇺🇸 US20240152764A1, United States (Publication: 2024-05-09)
  • 🇯🇵 JP2024066469A, Japan (Publication: 2024-05-15)
  • 🇪🇺 EP4365777A1, European Patent Office (Publication: 2024-05-08)

Method and Device with Defect Detection [Google Patent]

  • 🇰🇷 KR20240064412A, South Korea (Publication: 2024-05-13)
  • 🇺🇸 US20240153070A1, United States (Publication: 2024-05-09)
  • 🇨🇳 CN117994200A, China (Publication: 2024-05-07)
  • 🇪🇺 EP4365834A1, European Patent Office (Publication: 2024-05-08)
  • 🇯🇵 JP2024068105A, Japan (Publication: 2024-05-17)

Talks

Honors & Awards